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Ȩ Ȩ > ¿¬±¸¹®Çå > ¿µ¹® ³í¹®Áö > Journal of EEIS

Journal of EEIS

Current Result Document :

ÇѱÛÁ¦¸ñ(Korean Title) nul
¿µ¹®Á¦¸ñ(English Title) Development of BiTS(B-ISDN Integrated Test System) for B-ISDN Multi-Party Protocols
ÀúÀÚ(Author) Ki Young Kim   Joon Won Lee  
¿ø¹®¼ö·Ïó(Citation) VOL 04 NO. 02 PP. 0151 ~ 0158 (1999. 04)
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(Korean Abstract)
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(English Abstract)
In this paper, we describe the conformance testing system and the experiences of the B-ISDN signaling protocols for the ATM products(ATM Switch, Centralized Access Node System, Distributed Access Node System, Broadband Video Terminal Adapter and ATM Terminal etc) developed by HAN/B-ISDN project, which implement the Q.2110/2130, Q.2931 user/network side, Q.2961.1/2962/2963.1 user/network side and Q.2971 user/network side signaling protocols. The BiTS(B-ISDN Integrated Test System) is composed of functions for conformance/interoperability testing, call simulation/protocol monitoring and multi-party testing functions. Especially to develop the multi-party testing functions of BiTS, we prepared the ATS(Abstract Test Suite) which is written in TTCN(Tree Tabular Combined Notation) and the ETS(Executable Test Suite) which is implemented in the BiTS for B-ISDN multi-party testing. In the case of the multi-party testing for multi-party protocols, we made the test suite by applying the test method to control and observe multiple ports of the IUT concurrently. All of these test suites implemented in the BiTS are used for the conformance testing for ATM products in HAN/B-ISDN NTB(Network Test Bed) and test results are contributed to the improvement of ATM products.
Å°¿öµå(Keyword) B-ISDN   ATM   Protocol Tester   Conformance Test   Multi-party  
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